Filmetrics F54-XY-200 Automatic Optical Film thickness Measuring instrument

The Filmetrics F54-XY-200 automatic optical film thickness measuring instrument, with the aid of a spectral reflection system, can measure the film thickness of samples up to 200 x 200mm. The electric XY worktable automatically moves to the selected measurement point and provides thickness measurement at two points per second. You can choose from dozens of predefined polar, rectangular or linear measurement coordinate patterns, or create your own edited number of measurement points. This desktop system can be set up in just a few minutes and is accessible to anyone with basic computer skills.

Name：自動光學(xué)膜厚測量儀

Brand ： Filmetrics

Product model ： F54-XY-200

Place of Origin：美國

Filmetrics F54-XY-200 Automatic optical film thickness measuring instrument

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Product Introduction of Filmetrics F54-XY-200 Automatic Optical Film Thickness Measuring Instrument

Filmetrics F54-XY-200 Automatic optical film thickness measuring instrumentWith the help of the spectral reflection system, dimensions up to can be measured200 x 200mmThe film thickness of the sample is electricXYThe workbench automatically moves to the selected measurement point and provides thickness measurement at two points per second. You can choose from dozens of predefined polar, rectangular or linear measurement coordinate patterns, or create your own edited number of measurement points. This desktop system can be set up in just a few minutes and is accessible to anyone with basic computer skills.

Product features and advantages of Filmetrics F54-XY-200 Automatic optical Film thickness Measuring instrument

The automated film thickness drawing system enables rapid positioning and real-time result acquisition.
Measurable sample film layers: basically all smooth. Non-metallic films can all be measured.
The surveying and mapping results are available2Dor3DPresentation, facilitating users to view from different perspectives;

Measurement principle of Filmetrics F54-XY-200 automatic optical film thickness measuring instrument:

When incident light passes through the interfaces of different substances, some of the light will be reflected. Due to the wave nature of light, the reflected light from multiple interfaces interferes with each other, causing the multi-wavelength spectrum of the reflected light to oscillate. From the oscillation frequency of the spectrum, the distance between different interfaces can be determined, and thus the thickness of the material can be obtained (the more oscillations, the greater the thickness). At the same time, other material properties such as refractive index and roughness can also be obtained.

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